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Model XLE-3 large plateform metallurgical microscope is the newest medium inspection microscope in China. The adoption of reflected coaxial illumination ensures the bright-field observation. It can be connected with 135 camera, digital camera and image quantitative analysis. This instrument is suitable for the inspection requirements of a variety of electronic components including magnetic heads, LCD, and semiconductors. Its compact size, ease of operation, 10" x 10" stage travel and cost-effectiveness makes the XLE-3 an ideal inspection microscope offering superb operational versatility. The instrument is equipped with plan objective and wide-field eyepiece and obtains clear and smooth image. The unique character is the super large stage which can make quick-handed and knob-fine movement. The samples on the stage can be moved vertically and horizontally.

Product Features

1) Magnification: 40X - 500X
2) Large platform allow samples move fast in longitudinal and horizontal to expand the applied field
3) Match with OVM-TM softwar

Technological Parameter

1) The length of the mechanical tube is 160mm
2) Objective Lens

Magnification	Numerical aperture	Work Distance	Medium	Available range	Configuration
4×	0.10	17.912	Air	Bright Field	1
10×	0.25	6.544	Air	Bright Field	1
PC20×	0.40	1.05	Air	Bright Field	1
PC40×	0.65	0.736	Air	Bright Field	1

3) Eyepiece

Magnification	Focal	Field of view diameter	Remark
10×	25	18
12.5×	25	14	Optional

4) Magnification: 40X  - 500X
5) The area of the table is 4000mm × 300mm
6) The range of the lengthwise moving-254mm
7) The range of lateral moving-254mm
8) Focusing Organ: coaxial slight focusing organ, the focusing range is 36mm, the scale unit is 0.002mm
9) The standard of the halogen lamp is 12V 50W .The electrical source is inside
10) Lens transducer: five holes (four holes)
11) Eyepiece draw tube: Trinocular(Binocular)
12) Function: widely used in bright field, polarization, photography and so on
13) Weight: 17 Kg
14) Volume: 560mm × 530mm ×400mm

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